IEICE Trans

Shigeru YAMADA

Software Reliability Assessment with Multiple Changes of Testing-Environment Shinji INOUE Shigeru YAMADA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2015/10/01 Vol. E98-A No. 10 pp. 2031-2041 Type of Manuscript: Special Section PAPER (Special Section on Recent Developments on Reliability, Maintainability and Dependability) Category: Keyword: software reliability assessment, software reliability growth modeling, multiple change-point occurrence, testing-environmental function,
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Markovian Modeling for Operational Software Reliability Evaluation with Systemability Koichi TOKUNO Shigeru YAMADA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2012/09/01 Vol. E95-A No. 9 pp. 1469-1477 Type of Manuscript: Special Section PAPER (Special Section on Software Reliability Engineering) Category: Keyword: systemability, environmental factor, randomness of operational environment, Markov process, software reliability growth,
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Performability Modeling for Software System with Performance Degradation and Reliability Growth Koichi TOKUNO Shigeru YAMADA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/07/01 Vol. E92-A No. 7 pp. 1563-1571 Type of Manuscript: Special Section PAPER (Special Section on Recent Advances in Technologies for Assessing System Reliability) Category: Keyword: performability, real-time property, performance degradation, software reliability growth, infinite-server queueing model,
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Bayesian Optimal Release Time Based on Inflection S-Shaped Software Reliability Growth Model Hee Soo KIM Dong Ho PARK Shigeru YAMADA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/06/01 Vol. E92-A No. 6 pp. 1485-1493 Type of Manuscript: PAPER Category: Reliability, Maintainability and Safety Analysis Keyword: SRGM, failure detection rate, inflection rate, prior and posterior distribution, optimal software release time, expected total software cost, discrete beta distribution,
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Discrete Program-Size Dependent Software Reliability Assessment: Modeling, Estimation, and Goodness-of-Fit Comparisons Shinji INOUE Shigeru YAMADA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2007/12/01 Vol. E90-A No. 12 pp. 2891-2902 Type of Manuscript: PAPER Category: Reliability, Maintainability and Safety Analysis Keyword: software reliability assessment, modeling framework, program size, discrete Weibull distribution, heuristic parameter estimation algorithm, goodness-of-fit,
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Bayesian Approach to Optimal Release Policy of Software System HeeSoo KIM Shigeru YAMADA DongHo PARK
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2005/12/01 Vol. E88-A No. 12 pp. 3618-3626 Type of Manuscript: PAPER Category: Reliability, Maintainability and Safety Analysis Keyword: NHPP, software reliability growth model, optimal release policy, Bayesian approach,
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Markovian Software Availability Measurement Based on the Number of Restoration Actions Koichi TOKUNO Shigeru YAMADA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2000/05/25 Vol. E83-A No. 5 pp. 835-841 Type of Manuscript: Special Section PAPER (Special Section on Reliability Theory and Its Applications) Category: Keyword: software availability, imperfect debugging, software reliability growth, Markov process, quantitative assessment,
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A Markovian Software Availability Measurement with a Geometrically Decreasing Failure-Occurrence Rate Koichi TOKUNO Shigeru YAMADA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1995/06/25 Vol. E78-A No. 6 pp. 737-741 Type of Manuscript: PAPER Category: Reliability and Fault Analysis Keyword: software availability, measurement and assessment, Markov process, instantaneous software availability,
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A Wide-Band LCD Segment Driver IC without Sacrificing Low Output-Offset Variation Tetsuro ITAKURA Takeshi SHIMA Shigeru YAMADA Hironori MINAMIZAKI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1994/02/25 Vol. E77-A No. 2 pp. 380-387 Type of Manuscript: Special Section PAPER (Special Section on High-Performance MOS Analog Circuits) Category: Keyword: analog circuits and signal processing, sample-and-hold circuit, integrated electronics, LCD driver IC,
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Software Reliability Measurement and Assessment with Stochastic Differential Equations Shigeru YAMADA Mitsuhiro KIMURA Hiroaki TANAKA Shunji OSAKI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1994/01/25 Vol. E77-A No. 1 pp. 109-116 Type of Manuscript: Special Section PAPER (Special Section on Reliability) Category: Software Reliability Keyword: software reliability growth model, software fault, continuous state space, stochastic differential equation, maximum-likelihood estimation,
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A Markovian Imperfect Debugging Model for Software Reliability Measurement Koichi TOKUNOH Shigeru YAMADA Shunji OSAKI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1992/11/25 Vol. E75-A No. 11 pp. 1590-1596 Type of Manuscript: PAPER Category: Reliability, Availability and Vulnerability Keyword: software reliability measurement, imperfect debugging, semi-Markov process, software reliability growth,
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Software Availability Based on Reliability Growth Models Hiroshi OHTERA Shigeru YAMADA Hiroyuki NARIHISA
Publication: IEICE TRANSACTIONS (1976-1990) Publication Date: 1990/08/25 Vol. E73-E No. 8 pp. 1264-1269 Type of Manuscript: Special Section PAPER (Special Issue on Fault-Tolerant Systems) Category: Keyword:
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An Optimal Release Problem Based on a Testing-Effort Dependent Software Reliability Model Hiroshi OHTERA Shigeru YAMADA Hiroyuki NARIHISA
Publication: IEICE TRANSACTIONS (1976-1990) Publication Date: 1988/11/25 Vol. E71-E No. 11 pp. 1140-1145 Type of Manuscript: PAPER Category: Software Systems Keyword:
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A Testing-Effort Dependent Reliability Model for Computer Programs Shigeru YAMADA Hiroshi OHTERA Hiroyuki NARIHISA
Publication: IEICE TRANSACTIONS (1976-1990) Publication Date: 1986/11/25 Vol. E69-E No. 11 pp. 1217-1224 Type of Manuscript: PAPER Category: Software Technology Keyword:
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A Discrete Non-homogeneous Error Detection Rate Model for Software Reliability Takeshi KITAOKA Shigeru YAMADA Shunji OSAKI
Publication: IEICE TRANSACTIONS (1976-1990) Publication Date: 1986/08/25 Vol. E69-E No. 8 pp. 859-865 Type of Manuscript: PAPER Category: Software Technology Keyword:
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An Error Detection Rate Theory for Software Reliability Growth Models Shigeru YAMADA Shunji OSAKI
Publication: IEICE TRANSACTIONS (1976-1990) Publication Date: 1985/05/25 Vol. E68-E No. 5 pp. 292-296 Type of Manuscript: PAPER Category: Computers Keyword:
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Software Reliability Growth Modeling with Number of Test Runs Shigeru YAMADA Shunji OSAKI Hiroyuki NARIHISA
Publication: IEICE TRANSACTIONS (1976-1990) Publication Date: 1984/02/25 Vol. E67-E No. 2 pp. 79-83 Type of Manuscript: PAPER Category: Software Keyword:
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Cumulative Process Models for a Software Failure Process and Their Comparisons Shigeru YAMADA Shunji OSAKI
Publication: IEICE TRANSACTIONS (1976-1990) Publication Date: 1982/08/25 Vol. E65-E No. 8 pp. 457-463 Type of Manuscript: PAPER Category: Miscellaneous Keyword:
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