Shigeru YAMADA


Software Reliability Assessment with Multiple Changes of Testing-Environment
Shinji INOUE Shigeru YAMADA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2015/10/01
Vol. E98-A  No. 10  pp. 2031-2041
Type of Manuscript:  Special Section PAPER (Special Section on Recent Developments on Reliability, Maintainability and Dependability)
Category: 
Keyword: 
software reliability assessmentsoftware reliability growth modelingmultiple change-point occurrencetesting-environmental function
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Markovian Modeling for Operational Software Reliability Evaluation with Systemability
Koichi TOKUNO Shigeru YAMADA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/09/01
Vol. E95-A  No. 9  pp. 1469-1477
Type of Manuscript:  Special Section PAPER (Special Section on Software Reliability Engineering)
Category: 
Keyword: 
systemabilityenvironmental factorrandomness of operational environmentMarkov processsoftware reliability growth
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Performability Modeling for Software System with Performance Degradation and Reliability Growth
Koichi TOKUNO Shigeru YAMADA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/07/01
Vol. E92-A  No. 7  pp. 1563-1571
Type of Manuscript:  Special Section PAPER (Special Section on Recent Advances in Technologies for Assessing System Reliability)
Category: 
Keyword: 
performabilityreal-time propertyperformance degradationsoftware reliability growthinfinite-server queueing model
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Bayesian Optimal Release Time Based on Inflection S-Shaped Software Reliability Growth Model
Hee Soo KIM Dong Ho PARK Shigeru YAMADA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/06/01
Vol. E92-A  No. 6  pp. 1485-1493
Type of Manuscript:  PAPER
Category: Reliability, Maintainability and Safety Analysis
Keyword: 
SRGMfailure detection rateinflection rateprior and posterior distributionoptimal software release timeexpected total software costdiscrete beta distribution
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Discrete Program-Size Dependent Software Reliability Assessment: Modeling, Estimation, and Goodness-of-Fit Comparisons
Shinji INOUE Shigeru YAMADA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2007/12/01
Vol. E90-A  No. 12  pp. 2891-2902
Type of Manuscript:  PAPER
Category: Reliability, Maintainability and Safety Analysis
Keyword: 
software reliability assessmentmodeling frameworkprogram sizediscrete Weibull distributionheuristic parameter estimation algorithmgoodness-of-fit
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Bayesian Approach to Optimal Release Policy of Software System
HeeSoo KIM Shigeru YAMADA DongHo PARK 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/12/01
Vol. E88-A  No. 12  pp. 3618-3626
Type of Manuscript:  PAPER
Category: Reliability, Maintainability and Safety Analysis
Keyword: 
NHPPsoftware reliability growth modeloptimal release policyBayesian approach
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Markovian Software Availability Measurement Based on the Number of Restoration Actions
Koichi TOKUNO Shigeru YAMADA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/05/25
Vol. E83-A  No. 5  pp. 835-841
Type of Manuscript:  Special Section PAPER (Special Section on Reliability Theory and Its Applications)
Category: 
Keyword: 
software availabilityimperfect debuggingsoftware reliability growthMarkov processquantitative assessment
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A Markovian Software Availability Measurement with a Geometrically Decreasing Failure-Occurrence Rate
Koichi TOKUNO Shigeru YAMADA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1995/06/25
Vol. E78-A  No. 6  pp. 737-741
Type of Manuscript:  PAPER
Category: Reliability and Fault Analysis
Keyword: 
software availabilitymeasurement and assessmentMarkov processinstantaneous software availability
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A Wide-Band LCD Segment Driver IC without Sacrificing Low Output-Offset Variation
Tetsuro ITAKURA Takeshi SHIMA Shigeru YAMADA Hironori MINAMIZAKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/02/25
Vol. E77-A  No. 2  pp. 380-387
Type of Manuscript:  Special Section PAPER (Special Section on High-Performance MOS Analog Circuits)
Category: 
Keyword: 
analog circuits and signal processingsample-and-hold circuitintegrated electronicsLCD driver IC
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Software Reliability Measurement and Assessment with Stochastic Differential Equations
Shigeru YAMADA Mitsuhiro KIMURA Hiroaki TANAKA Shunji OSAKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/01/25
Vol. E77-A  No. 1  pp. 109-116
Type of Manuscript:  Special Section PAPER (Special Section on Reliability)
Category: Software Reliability
Keyword: 
software reliability growth modelsoftware faultcontinuous state spacestochastic differential equationmaximum-likelihood estimation
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A Markovian Imperfect Debugging Model for Software Reliability Measurement
Koichi TOKUNOH Shigeru YAMADA Shunji OSAKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1992/11/25
Vol. E75-A  No. 11  pp. 1590-1596
Type of Manuscript:  PAPER
Category: Reliability, Availability and Vulnerability
Keyword: 
software reliability measurementimperfect debuggingsemi-Markov processsoftware reliability growth
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Software Availability Based on Reliability Growth Models
Hiroshi OHTERA Shigeru YAMADA Hiroyuki NARIHISA 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1990/08/25
Vol. E73-E  No. 8  pp. 1264-1269
Type of Manuscript:  Special Section PAPER (Special Issue on Fault-Tolerant Systems)
Category: 
Keyword: 
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An Optimal Release Problem Based on a Testing-Effort Dependent Software Reliability Model
Hiroshi OHTERA Shigeru YAMADA Hiroyuki NARIHISA 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1988/11/25
Vol. E71-E  No. 11  pp. 1140-1145
Type of Manuscript:  PAPER
Category: Software Systems
Keyword: 
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A Testing-Effort Dependent Reliability Model for Computer Programs
Shigeru YAMADA Hiroshi OHTERA Hiroyuki NARIHISA 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1986/11/25
Vol. E69-E  No. 11  pp. 1217-1224
Type of Manuscript:  PAPER
Category: Software Technology
Keyword: 
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A Discrete Non-homogeneous Error Detection Rate Model for Software Reliability
Takeshi KITAOKA Shigeru YAMADA Shunji OSAKI 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1986/08/25
Vol. E69-E  No. 8  pp. 859-865
Type of Manuscript:  PAPER
Category: Software Technology
Keyword: 
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An Error Detection Rate Theory for Software Reliability Growth Models
Shigeru YAMADA Shunji OSAKI 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1985/05/25
Vol. E68-E  No. 5  pp. 292-296
Type of Manuscript:  PAPER
Category: Computers
Keyword: 
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Software Reliability Growth Modeling with Number of Test Runs
Shigeru YAMADA Shunji OSAKI Hiroyuki NARIHISA 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1984/02/25
Vol. E67-E  No. 2  pp. 79-83
Type of Manuscript:  PAPER
Category: Software
Keyword: 
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Cumulative Process Models for a Software Failure Process and Their Comparisons
Shigeru YAMADA Shunji OSAKI 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1982/08/25
Vol. E65-E  No. 8  pp. 457-463
Type of Manuscript:  PAPER
Category: Miscellaneous
Keyword: 
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