Shigeru MITSUI


Focused Ion Beam Trimming Techniques for MMIC Circuit Optimization
Takahide ISHIKAWA Makio KOMARU Kazuhiko ITOH Katsuya KOSAKI Yasuo MITSUI Mutsuyuki OTSUBO Shigeru MITSUI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/06/25
Vol. E76-C  No. 6  pp. 891-900
Type of Manuscript:  Special Section PAPER (Special Issue on Microwave and Millimeter-Wave Technology for Advanced Functions and Size-Reductions)
Category: 
Keyword: 
FIB (Focused Ion Beam)trimmingcircuit optimizationMMIC
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