Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1996/06/25
Vol. E79-C
No. 6
pp. 767-771
Type of Manuscript:
Special Section PAPER (Special Issue on ULSI Memory Technology)
Category: Static RAMs
Keyword:
soft errors, SOI SRAM, α-particle-induced bipolar current, critical α-particle-induced initial charge, soft error rate, |
