Shigeo SATOH


Theoretical Study of Alpha-Particle-lnduced Soft Errors in Submicron SOI SRAM
Yoshiharu TOSAKA Kunihiro SUZUKI Shigeo SATOH Toshihiro SUGII 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/06/25
Vol. E79-C  No. 6  pp. 767-771
Type of Manuscript:  Special Section PAPER (Special Issue on ULSI Memory Technology)
Category: Static RAMs
Keyword: 
soft errorsSOI SRAM, α-particle-induced bipolar currentcritical α-particle-induced initial chargesoft error rate
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