Shigenori HARA


Soft-Error Study of DRAMs with Retrograde Well Structure by New Evaluation Method
Yoshikazu OHNO Hiroshi KIMURA Ken-ichiro SONODA Tadashi NISHIMURA Shin-ichi SATOH Hirokazu SAYAMA Shigenori HARA Mikio TAKAI Hirokazu MIYOSHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/03/25
Vol. E77-C  No. 3  pp. 399-405
Type of Manuscript:  Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
soft-errorDRAMmicroprobeprotonmapping
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