Sheng-Wei WANG


Reducing Aging Effects on Ternary CAM
Ing-Chao LIN Yen-Han LEE Sheng-Wei WANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/07/01
Vol. E99-C  No. 7  pp. 878-891
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
ternary content addressable memory (CAM)negative bias temperature instability (NBTI)positive bias temperature instability (PBTI)reliabilitypower gating
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