Seichi OKAMURA


A Non-Reflection-Influence Method for On-Line Measurement of Permittivity Using Microwave Free-Space Technique
Zhihong MA Seichi OKAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/12/25
Vol. E81-C  No. 12  pp. 1936-1941
Type of Manuscript:  PAPER
Category: Microwave and Millimeter Wave Technology
Keyword: 
microwavepermittivitymeasurementnon-reflectionon-linefree-space technique
 Summary | Full Text:PDF(489.2KB)

Analysis and Elimination of the Reflection lnfluence on Microwave Attenuation Measurement for Moisture Determination
Zhihong MA Seichi OKAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/10/25
Vol. E80-C  No. 10  pp. 1324-1329
Type of Manuscript:  PAPER
Category: Microwave and Millimeter Wave Technology
Keyword: 
microwaveattenuationreflectionmoisture contentdensitypropagation distance
 Summary | Full Text:PDF(525.4KB)