Satoshi OHNO


Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool
Yoshinobu HIGAMI Satoshi OHNO Hironori YAMAOKA Hiroshi TAKAHASHI Yoshihiro SHIMIZU Takashi AIKYO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2012/04/01
Vol. E95-D  No. 4  pp. 1093-1100
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
fault diagnosistest generationtransition faultsstuck-at ATPG
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