Satoshi IKEDA

Selecting Help Messages by Using Robust Grammar Verification for Handling Out-of-Grammar Utterances in Spoken Dialogue Systems
Kazunori KOMATANI Yuichiro FUKUBAYASHI Satoshi IKEDA Tetsuya OGATA Hiroshi G. OKUNO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/12/01
Vol. E93-D  No. 12  pp. 3359-3367
Type of Manuscript:  PAPER
Category: Speech and Hearing
Keyword: 
spoken dialogue system, help generation, out-of-grammar utterances, novice user, utterance history, 
 Summary | Full Text:PDF
Cascaded Modulation Scheme and Its Application to Optical Multi-Channel Signal Transmission Systems
Koji KIKUSHIMA Toshihito FUJIWARA Satoshi IKEDA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2007/02/01
Vol. E90-B  No. 2  pp. 195-208
Type of Manuscript:  PAPER
Category: Fiber-Optic Transmission for Communications
Keyword: 
optical transmission systems, optical modulation scheme, CATV, 
 Summary | Full Text:PDF
Simultaneous Optical Transmission of AM-VSB/64-QAM/FM/TC8PSK/QPSK Multi-Channel Television Signals by Super-Wideband FM and BS/CS-RF Conversion Techniques
Koji KIKUSHIMA Toshihito FUJIWARA Satoshi IKEDA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2006/11/01
Vol. E89-B  No. 11  pp. 3008-3020
Type of Manuscript:  PAPER
Category: Fiber-Optic Transmission for Communications
Keyword: 
optical transmission, optical access networks, CATV, multi-channel TV transmission, 
 Summary | Full Text:PDF
A Site Specification Method of Gate Oxide Breakdown Spots by a New Test Structure of MOS Capacitors
Satoshi IKEDA Hidetsugu UCHIDA Norio HIRASHITA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/05/01
Vol. E85-C  No. 5  pp. 1134-1137
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
MOS capacitor, gate oxide, OBIC, breakdown spot, XTEM, 
 Summary | Full Text:PDF