Sangyoon HAN


Efficient Test Generation Using Redundancy Identification
Sangyoon HAN Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/09/25
Vol. E83-D  No. 9  pp. 1814-1815
Type of Manuscript:  LETTER
Category: Fault Tolerance
Keyword: 
test pattern generationredundant faults
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