Ryuji OHMURA


Accomplishment of At-Speed BISR for Embedded DRAMs
Yoshihiro NAGURA Yoshinori FUJIWARA Katsuya FURUE Ryuji OHMURA Tatsunori KOMOIKE Takenori OKITAKA Tetsushi TANIZAKI Katsumi DOSAKA Kazutami ARIMOTO Yukiyoshi KODA Tetsuo TADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10  pp. 1498-1505
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: BIST
Keyword: 
at-speed testBISRembedded DRAMtest cost reduction
 Summary | Full Text:PDF

A Practical Test System with a Fuzzy Logic Controller
Takeshi KOYAMA Ryuji OHMURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7  pp. 868-873
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
fuzzy test systemadaptive controlstable quality assurancestability condition
 Summary | Full Text:PDF