Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2002/10/01 Vol. E85-DNo. 10pp. 1498-1505 Type of Manuscript: Special Section PAPER (Special Issue on Test and Verification of VLSI) Category: BIST Keyword: at-speed test, BISR, embedded DRAM, test cost reduction,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1995/07/25 Vol. E78-DNo. 7pp. 868-873 Type of Manuscript: Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems) Category: Keyword: fuzzy test system, adaptive control, stable quality assurance, stability condition,
