Ryo HARADA

SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects
Ryo HARADA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7  pp. 1461-1467
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
soft error, single event transient (SET), pulse-width, pulse-width modulation, measurement circuit, within-die process variation, 
 Summary | Full Text:PDF(1.8MB)
Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-Inverter-Delay Resolution
Ryo HARADA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Vol. E93-A  No. 12  pp. 2417-2423
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
soft error, single event transient (SET), pulse width, measurement circuit, 
 Summary | Full Text:PDF(675KB)