Ronald REANO


Electro-Optic Probing for Microwave Diagnostics
John F. WHITAKER Kyoung YANG Ronald REANO Linda P. B. KATEHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/07/01
Vol. E86-C  No. 7  pp. 1328-1337
Type of Manuscript:  INVITED PAPER (Special Issue on Recent Progress in Microwave and Millimeter-wave Photonics Technologies)
Category: Measurements Techniques
Keyword: 
microwave measurementsultrafast opticselectro-optic samplingelectric-field probing
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