Norio KUJI


EB-Testing-Pad Method and its Evaluation by Actual Devices
Norio KUJI Takako ISHIHARA Shigeru NAKAJIMA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10  pp. 1558-1563
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: EB Tester
Keyword: 
E-beam testerobservabilitystacked viastesting padsmulti level wiring
 Summary | Full Text:PDF(626.7KB)

Improvement of E-Beam Observability by Testing-Pad Placement in LSI Design Layout
Norio KUJI Tadao TAKEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/02/25
Vol. E82-C  No. 2  pp. 387-392
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
E-beam testerobservabilitystacked viastesting padsmulti-level wiringlocal field effects
 Summary | Full Text:PDF(388.5KB)

Guided-Probe Diagnosis of LSIs Containing Macrocells
Norio KUJI Tadao TAKEDA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7  pp. 731-737
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Beam Testing/Diagnosis
Keyword: 
electron beam testerguided-probe diagnosismacrocellmemory macrologic simulationlogic modelCAD navigation
 Summary | Full Text:PDF(617.7KB)

Cone/Block Methods for Logic Simulation Time Reduction in E-Beam Guided-Probe Diagnosis
Norio KUJI Kazuhiro SHIRAKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4  pp. 560-566
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
logic simulationcone/block methodsguide-probe diagnosiselectron beam testing
 Summary | Full Text:PDF(588KB)

E-Beam Static Fault Imaging with a CAD Interface and Its Application to Marginal Fault Diagnosis
Norio KUJI Kiyoshi MATSUMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4  pp. 552-559
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
E-beam testingfault diagnosismarginal faultfault imagefault tracing
 Summary | Full Text:PDF(733.6KB)