Norio KOIKE


A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission
Toshihiro MATSUDA Hiroaki TAKEUCHI Akira MURAMATSU Hideyuki IWATA Takashi OHZONE Kyoji YAMASHITA Norio KOIKE Ken-ichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 811-816
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
MOSFETphotoemissionhot carriergate length
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A Modeling Methodology and Body Effect Analysis for Hot-Carrier Reliability Simulation of Logic Circuits
Norio KOIKE Hirokazu YONEZAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/06/01
Vol. E85-C  No. 6  pp. 1356-1366
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
hot carriersecondary hot electronsimulation
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A New Test Structure for Precise Location Measurement of Hot-Carrier-Induced Photoemission Peak in Subquarter-Micron MOSFETs
Toshihiro MATSUDA Mari FUNADA Takashi OHZONE Etsumasa KAMEDA Shinji ODANAKA Kyoji TAMASHITA Norio KOIKE Ken-ichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/05/01
Vol. E85-C  No. 5  pp. 1125-1133
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
test structureMOSFEThot carrierphotoemission
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A Simulation Methodology for Bidirectional Hot-Carrier Degradation in a Static RAM Circuit
Norio KOIKE Masato TAKEO Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/06/25
Vol. E81-C  No. 6  pp. 959-967
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
hot carrierbidirectional stressingcircuit reliabilitysimulation
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Hot-Carrier Aging Simulations of Voltage Controlled Oscillator
Norio KOIKE Hirokazu NISHIMURA Masato TAKEO Tomoyuki MORII Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/09/25
Vol. E79-C  No. 9  pp. 1285-1288
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
hot carriercircuit reliabilitysimulationBERT
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