Increasing Importance of Electronic Thermal Noise in Sub-0.1 µm Si-MOSFETs Nobuyuki SANO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2000/08/25 Vol. E83-CNo. 8pp. 1203-1211 Type of Manuscript: INVITED PAPER (Special Issue on 1999 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'99)) Category: Device Modeling and Simulation Keyword: Monte Carlo simulation, current fluctuation, thermal noise, shot noise, central limit theorem,
