Nobuyuki SANO

Increasing Importance of Electronic Thermal Noise in Sub-0.1 µm Si-MOSFETs
Nobuyuki SANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/08/25
Vol. E83-C  No. 8  pp. 1203-1211
Type of Manuscript:  INVITED PAPER (Special Issue on 1999 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'99))
Category: Device Modeling and Simulation
Monte Carlo simulationcurrent fluctuationthermal noiseshot noisecentral limit theorem
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A Compact Model for the Current-Voltage Characteristics of a Single Electron Transistor in the Resonant Transport Mode
Kenji NATORI Nobuyuki SANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/09/25
Vol. E82-C  No. 9  pp. 1599-1606
Type of Manuscript:  Special Section PAPER (Special Issue on Integrated Electronics and New System Paradigms)
Category: Quantum Devices and Circuits
single electron transistorSETresonant tunnelingcurrent-voltage characteristicsquantum dotcurrent map
 Summary | Full Text:PDF(553.1KB)