Nobuto ONO

Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations
Takaaki OKUMURA Atsushi KUROKAWA Hiroo MASUDA Toshiki KANAMOTO Masanori HASHIMOTO Hiroshi TAKAFUJI Hidenari NAKASHIMA Nobuto ONO Tsuyoshi SAKATA Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/04/01
Vol. E92-A  No. 4  pp. 990-997
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
SSTA, output, transition time, gate delay model, process variation, 
 Summary | Full Text:PDF
Proposal of Metrics for SSTA Accuracy Evaluation
Hiroyuki KOBAYASHI Nobuto ONO Takashi SATO Jiro IWAI Hidenari NAKASHIMA Takaaki OKUMURA Masanori HASHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2007/04/01
Vol. E90-A  No. 4  pp. 808-814
Type of Manuscript:  Special Section PAPER (Special Section on Selected Papers from the 19th Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
statistical static timing analysis, statistical max operation, DFM, SoC, 
 Summary | Full Text:PDF
On-Chip Thermal Gradient Analysis Considering Interdependence between Leakage Power and Temperature
Takashi SATO Junji ICHIMIYA Nobuto ONO Masanori HASHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/12/01
Vol. E89-A  No. 12  pp. 3491-3499
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Simulation and Verification
Keyword: 
thermal gradient simulation, leakage power, temperature-dependent leakage power, power calculation, leakage model, 
 Summary | Full Text:PDF
On-Chip Thermal Gradient Analysis and Temperature Flattening for SoC Design
Takashi SATO Junji ICHIMIYA Nobuto ONO Koutaro HACHIYA Masanori HASHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/12/01
Vol. E88-A  No. 12  pp. 3382-3389
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Prediction and Analysis
Keyword: 
thermal simulation, thermal gradient, temperature flattening, clock skew, reliability, timing, 
 Summary | Full Text:PDF