Naoto TOMITA


Statistical Memory Yield Analysis and Redundancy Design Considering Fabrication Line Improvement
Ken-ichi IMAMIYA Jun-ichi MIYAMOTO Nobuaki OHTSUKA Naoto TOMITA Yumiko IYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/11/25
Vol. E76-C  No. 11  pp. 1626-1631
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Memories)
Category: Non-volatile Memory
Keyword: 
redundancymemoryyieldEPROM
 Summary | Full Text:PDF(533.4KB)