Naoto HAYASAKA

A Practical Analog BIST Cooperated with an LSI Tester
Takanori KOMURO Naoto HAYASAKA Haruo KOBAYASHI Hiroshi SAKAYORI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/02/01
Vol. E89-A  No. 2  pp. 465-468
Type of Manuscript:  Special Section LETTER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
LSI testing, analog circuit, BIST, equivalent-time sampling, sampler, 
 Summary | Full Text:PDF
Input-Dependent Sampling-Time Error Effects Due to Finite Clock Slope in MOS Samplers
Naoto HAYASAKA Haruo KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/06/01
Vol. E87-C  No. 6  pp. 1015-1021
Type of Manuscript:  Special Section LETTER (Special Section on Analog Circuit and Device Technologies)
Category: 
Keyword: 
sampling, jitter, MOS switch, track/hold circuit, ADC, 
 Summary | Full Text:PDF