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A Flexible Microwave De-Embedding Method for On-Wafer Noise Parameter Characterization of MOSFETs
Yueh-Hua WANG Ming-Hsiang CHO Lin-Kun WU | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2009/09/01
Vol. E92-C
No. 9
pp. 1157-1162
Type of Manuscript:
Special Section PAPER (Special Section on Recent Progress in Microwave and Millimeter-Wave Technologies and Their Applications)
Category:
Keyword:
de-embedding, microwave, MOSFETs, noise, RF, silicon, | | | Summary | Full Text:PDF(717.4KB) | |
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Scalable Short-Open-Interconnect S-Parameter De-Embedding Method for On-Wafer Microwave Characterization of Silicon MOSFETs
Ming-Hsiang CHO Yueh-Hua WANG Lin-Kun WU | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2007/09/01
Vol. E90-C
No. 9
pp. 1708-1714
Type of Manuscript:
Special Section PAPER (Special Section on Microwave and Millimeter-Wave Technology)
Category: Active Devices/Circuits
Keyword:
calibration, de-embedding, CMOS, microwave, parasitics, S-parameters, | | | Summary | Full Text:PDF(1.7MB) | |
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