IEICE Trans

Michihiro SHINTANI

Cost-Efficient Recycled FPGA Detection through Statistical Performance Characterization Framework Foisal AHMED Michihiro SHINTANI Michiko INOUE
Publication: Publication Date: 2020/09/01 Vol. E103-A No. 9 pp. 1045-1053 Type of Manuscript: Special Section PAPER (Special Section on Circuits and Systems) Category: Keyword: field-programmable gate array (FPGA), recycled FPGA detection, compressed sensing, FPGA fingerprinting,
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Identification and Application of Invariant Critical Paths under NBTI Degradation Song BIAN Shumpei MORITA Michihiro SHINTANI Hiromitsu AWANO Masayuki HIROMOTO Takashi SATO
Publication: Publication Date: 2017/12/01 Vol. E100-A No. 12 pp. 2797-2806 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: NBTI, aging effect, invariant critical path, processor,
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Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement for NBTI Mitigation Shumpei MORITA Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO
Publication: Publication Date: 2017/07/01 Vol. E100-A No. 7 pp. 1464-1472 Type of Manuscript: Special Section PAPER (Special Section on Design Methodologies for System on a Chip) Category: Keyword: NBTI mitigation, reliability, transistor aging, performance degradation, internal node control,
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Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2016/07/01 Vol. E99-A No. 7 pp. 1400-1409 Type of Manuscript: Special Section PAPER (Special Section on Design Methodologies for System on a Chip) Category: Keyword: NBTI, reliability, static timing analysis, timing characterization, aging-aware timing library,
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IDDQ Outlier Screening through Two-Phase Approach: Clustering-Based Filtering and Estimation-Based Current-Threshold Determination Michihiro SHINTANI Takashi SATO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2014/08/01 Vol. E97-D No. 8 pp. 2095-2104 Type of Manuscript: PAPER Category: Dependable Computing Keyword: IDDQ testing, k-means clustering, statistical leakage current analysis, Bayes' theorem, simulated annealing,
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Device-Parameter Estimation through IDDQ Signatures Michihiro SHINTANI Takashi SATO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2013/02/01 Vol. E96-D No. 2 pp. 303-313 Type of Manuscript: PAPER Category: Dependable Computing Keyword: IDDQ testing, statistical leakage current analysis, Bayes' theorem,
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A Variable-Length Coding Adjustable for Compressed Test Application Hideyuki ICHIHARA Toshihiro OHARA Michihiro SHINTANI Tomoo INOUE
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2007/08/01 Vol. E90-D No. 8 pp. 1235-1242 Type of Manuscript: PAPER Category: Dependable Computing Keyword: test compression, variable-length coding, test application time, ATE, Huffman code, and test environment,
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Huffman-Based Test Response Coding Hideyuki ICHIHARA Michihiro SHINTANI Tomoo INOUE
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2005/01/01 Vol. E88-D No. 1 pp. 158-161 Type of Manuscript: LETTER Category: Dependable Computing Keyword: Huffman code, test compression, test response, test application time, ATE,
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