Michiharu NAKAMURA


Efficient Method to Measure IMD of Power Amplifier with Simplified Phase Determination Procedure to Clarify Memory Effect Origins
Takeshi TAKANO Yasuyuki OHISHI Shigekazu KIMURA Michiharu NAKAMURA Kazuo NAGATANI Eisuke FUKUDA Yoshimasa DAIDO Kiyomichi ARAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/07/01
Vol. E93-C  No. 7  pp. 991-999
Type of Manuscript:  Special Section PAPER (Special Section on Recent Progress in Microwave and Millimeter-Wave Technologies)
Category: 
Keyword: 
power amplifierIMD measurementmemory effectbias impedanceeven order nonlinearity
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