Masuri OTHMAN


An Efficient Fault Syndromes Simulator for SRAM Memories
Wan Zuha WAN HASAN Izhal ABD HALIN Roslina MOHD SIDEK Masuri OTHMAN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C  No. 5  pp. 639-646
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
testingdiagnosiscoupling faultsstuck-at faults March test algorithmbuilt-in self-test (BIST)built-in self-diagnosis (BISD)automated march-based test algorithmSRAM
 Summary | Full Text:PDF(1.8MB)