Masato TAKEO


A Simulation Methodology for Bidirectional Hot-Carrier Degradation in a Static RAM Circuit
Norio KOIKE Masato TAKEO Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/06/25
Vol. E81-C  No. 6  pp. 959-967
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
hot carrierbidirectional stressingcircuit reliabilitysimulation
 Summary | Full Text:PDF(742.9KB)

Ferroelectric Memory Circuit Technology and the Application to Contactless IC Card
Koji ASARI Hiroshige HIRANO Toshiyuki HONDA Tatsumi SUMI Masato TAKEO Nobuyuki MORIWAKI George NAKANE Tetsuji NAKAKUMA Shigeo CHAYA Toshio MUKUNOKI Yuji JUDAI Masamichi AZUMA Yasuhiro SHIMADA Tatsuo OTSUKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/25
Vol. E81-C  No. 4  pp. 488-496
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Memory Devices Using High-Dielectric-Constant and Ferroelectric Thin Films)
Category: 
Keyword: 
FeRAMhigh speedlow voltagelow power consumptionnon-volatilecontactless IC card
 Summary | Full Text:PDF(1.2MB)

Hot-Carrier Aging Simulations of Voltage Controlled Oscillator
Norio KOIKE Hirokazu NISHIMURA Masato TAKEO Tomoyuki MORII Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/09/25
Vol. E79-C  No. 9  pp. 1285-1288
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
hot carriercircuit reliabilitysimulationBERT
 Summary | Full Text:PDF(343.8KB)