Masaru HARAGUCHI

A Continuous-Adaptive DDRx Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test
Masaru HARAGUCHI Tokuya OSAWA Akira YAMAZAKI Chikayoshi MORISHIMA Toshinori MORIHARA Yoshikazu MOROOKA Yoshihiro OKUNO Kazutami ARIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C  No. 4  pp. 453-459
Type of Manuscript:  Special Section PAPER (Special Section on Low-Leakage, Low-Voltage, Low-Power and High-Speed Technologies for System LSIs in Deep-Submicron Era)
Category: 
Keyword: 
DDR interface, SoC, round-trip-time, loop-backed test, 
 Summary | Full Text:PDF
A Study of Sense-Voltage Margins in Low-Voltage-Operating Embedded DRAM Macros
Akira YAMAZAKI Fukashi MORISHITA Naoya WATANABE Teruhiko AMANO Masaru HARAGUCHI Hideyuki NODA Atsushi HACHISUKA Katsumi DOSAKA Kazutami ARIMOTO Setsuo WAKE Hideyuki OZAKI Tsutomu YOSHIHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/10/01
Vol. E88-C  No. 10  pp. 2020-2027
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
embedded memory, DRAM, voltage margin, low voltage, system on chip, 
 Summary | Full Text:PDF
A Low Power Embedded DRAM Macro for Battery-Operated LSIs
Takeshi FUJINO Akira YAMAZAKI Yasuhiko TAITO Mitsuya KINOSHITA Fukashi MORISHITA Teruhiko AMANO Masaru HARAGUCHI Makoto HATAKENAKA Atsushi AMO Atsushi HACHISUKA Kazutami ARIMOTO Hideyuki OZAKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/12/01
Vol. E86-A  No. 12  pp. 2991-3000
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Power Optimization
Keyword: 
embedded memory, DRAM, low power, system on chip, 
 Summary | Full Text:PDF