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Masanori ODAKA
Noise Reduction Techniques for a 64-kb ECL-CMOS SRAM with a 2-ns Cycle Time
Kenichi OHHATA
Yoshiaki SAKURAI
Hiroaki NAMBU
Kazuo KANETANI
Youji IDEI
Toshirou HIRAMOTO
Nobuo TAMBA
Kunihiko YAMAGUCHI
Masanori ODAKA
Kunihiko WATANABE
Takahide IKEDA
Noriyuki HOMMA
Publication:
IEICE TRANSACTIONS on Electronics
Publication Date:
1993/11/25
Vol.
E76-C
No.
11
pp.
1611-1619
Type of Manuscript:
Special Section PAPER (Special Issue on LSI Memories)
Category:
SRAM
Keyword:
ECL-CMOS SRAM
,
64-kb
,
noise reduction
,
crosstalk
,
Summary
|
Full Text:PDF
Redundancy Technique for Ultra-High-Speed Static RAMs
Hiroaki NAMBU
Kazuo KANETANI
Youji IDEI
Kunihiko YAMAGUCHI
Toshirou HIRAMOTO
Nobuo TAMBA
Kunihiko WATANABE
Masanori ODAKA
Takahide IKEDA
Kenichi OHHATA
Yoshiaki SAKURAI
Noriyuki HOMMA
Publication:
IEICE TRANSACTIONS on Electronics
Publication Date:
1993/04/25
Vol.
E76-C
No.
4
pp.
641-648
Type of Manuscript:
PAPER
Category:
Integrated Electronics
Keyword:
redundancy technique
,
static RAM (SRAM)
,
focused ion beam (FIB)
,
laser chemical vapor deposition (L-CVD)
,
access time
,
Summary
|
Full Text:PDF
High-Speed Sensing Techniques for Ultrahigh-Speed SRAM's
Hiroaki NAMBU
Kazuo KANETANI
Youji IDEI
Noriyuki HOMMA
Kunihiko YAMAGUCHI
Toshirou HIRAMOTO
Nobuo TAMBA
Masanori ODAKA
Kunihiko WATANABE
Takahide IKEDA
Kenichi OHHATA
Yoshiaki SAKURAI
Publication:
IEICE TRANSACTIONS on Electronics
Publication Date:
1992/04/25
Vol.
E75-C
No.
4
pp.
530-538
Type of Manuscript:
Special Section PAPER (Joint Special Issue on the 1991 VLSI Circuits Symposium)
Category:
Keyword:
Summary
|
Full Text:PDF