| Masanori HASHIMOTO
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Stress Probability Computation for Estimating NBTI-Induced Delay Degradation Hiroaki KONOURA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/12/01
Vol. E94-A
No. 12
pp. 2545-2553
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Device and Circuit Modeling and Analysis Keyword: NBTI, stress probability, timing analysis, | | Summary | Full Text:PDF | |
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Accuracy Enhancement of Grid-Based SSTA by Coefficient Interpolation Shinyu NINOMIYA Masanori HASHIMOTO | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Vol. E93-A
No. 12
pp. 2441-2446
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Device and Circuit Modeling and Analysis Keyword: statistical timing analysis, manufacturing variability, | | Summary | Full Text:PDF | |
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Clock Skew Evaluation Considering Manufacturing Variability in Mesh-Style Clock Distribution Shinya ABE Masanori HASHIMOTO Takao ONOYE | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/12/01
Vol. E91-A
No. 12
pp. 3481-3487
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Device and Circuit Modeling and Analysis Keyword: mesh-style clock distribution, clock skew, | | Summary | Full Text:PDF | |
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