IEICE Trans

Masanari TANIGUCHI

FOREWORD Masanari TANIGUCHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2009/08/01 Vol. E92-C No. 8 pp. 981-981 Type of Manuscript: FOREWORD Category: Keyword:
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Formation Mechanism of Dark Bridge between Contacts with Very Slow Opening Speed Hiroyuki ISHIDA Shosuke SUZUKI Hideaki SONE Hiroshi INOUE Masanari TANIGUCHI Tasuku TAKAGI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/08/01 Vol. E89-C No. 8 pp. 1136-1140 Type of Manuscript: Special Section PAPER (Special Section on Recent Development of Electromechanical Devices (Selected Papers from IS-EMD2005)) Category: Contact Phenomena Keyword: dark bridge, bridge shape, thermal expansion,
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Relationship between Length and Diameter of Contact Bridge Formed under Thermal Equilibrium Condition Hiroyuki ISHIDA Masanari TANIGUCHI Hideaki SONE Hiroshi INOUE Tasuku TAKAGI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/08/01 Vol. E88-C No. 8 pp. 1566-1572 Type of Manuscript: Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices--Selected Papers from International Session on Electro-Mechanical Devices 2004 (IS-EMD2004)--) Category: Contact Phenomena Keyword: contact bridge, thermal flow, thermal equilibrium condition,
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Experimental Study on the Relationships between Bridge-Voltage and Gap Length in Slowly Opening Ag Contacts Hiroyuki ISHIDA Masanari TANIGUCHI Tasuku TAKAGI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/06/01 Vol. E86-C No. 6 pp. 880-884 Type of Manuscript: Special Section PAPER (Special Issue on Recent Development of Electro-Mechanical Devices (IS-EMD 2002)) Category: Contact Phenomena Keyword: electrical contact, bridge-voltage, contact gap,
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Application of Digital Image Measuring System (DIMS) and Shadow Image Processing Technique (SIPT) to Damage Analysis of Electrical Sliding Contact Surface Masanari TANIGUCHI Miyataka KANAZAWA Tasuku TAKAGI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1998/03/25 Vol. E81-C No. 3 pp. 377-383 Type of Manuscript: Special Section PAPER (Special Issue on Electromechanical Devices and their Surface Science) Category: Keyword: electrical sliding contact, damage analysis of contact surface, digital image measuring system, shadow image processing technique,
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Holographic Pattern Measurement of Printed Circuit Board (PCB) Vibration due to Mounted Electromagnetic Relay Operation Masanari TANIGUCHI Junichi FUKUDA Tasuku TAKAGI Isamu AKASAKI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1993/07/25 Vol. E76-A No. 7 pp. 1170-1173 Type of Manuscript: Special Section LETTER (Special Section of Letters Selected from the 1993 IEICE Spring Conference) Category: Keyword: printed circuit board, vibration measurement, electromagnetic relay, holography,
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Observation of Electrical Contact Surface by Using Digital Image Signal Processing System Masanari TANIGUCHI Morimichi MIZUNO Hideaki SONE Tasuku TAKAGI
Publication: IEICE TRANSACTIONS (1976-1990) Publication Date: 1989/10/25 Vol. E72-E No. 10 pp. 1069-1071 Type of Manuscript: Special Section LETTER (Special Issue on 1989 Autumn National Convention IEICE) Category: Component and Materials Keyword:
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An Experiment on a Relationship between Contact Voltage and Thermal Deformation of Contact Spring Masanari TANIGUCHI Masato OKI Tasuku TAKAGI
Publication: IEICE TRANSACTIONS (1976-1990) Publication Date: 1988/04/25 Vol. E71-E No. 4 pp. 272-273 Type of Manuscript: Special Section LETTER (Special Issue: Papers from 1988 Spring Convention IEICE) Category: Components and Materials Keyword:
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An Application of Holographic Pattern Measuring Method for the Thermal Distortion of Printed Circuit Board (PCB) Due to Current Flow Masanari TANIGUCHI Masato OKI Tasuku TAKAGI
Publication: IEICE TRANSACTIONS (1976-1990) Publication Date: 1987/11/25 Vol. E70-E No. 11 pp. 1086-1088 Type of Manuscript: Special Section LETTER (Special Issue: Papers from 1987 National Conference on Semicondutor Devices and Materials IEICE) Category: Measurement Keyword:
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