Masanari TANIGUCHI


FOREWORD
Masanari TANIGUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/08/01
Vol. E92-C  No. 8  pp. 981-981
Type of Manuscript:  FOREWORD
Category: 
Keyword: 
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Formation Mechanism of Dark Bridge between Contacts with Very Slow Opening Speed
Hiroyuki ISHIDA Shosuke SUZUKI Hideaki SONE Hiroshi INOUE Masanari TANIGUCHI Tasuku TAKAGI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/08/01
Vol. E89-C  No. 8  pp. 1136-1140
Type of Manuscript:  Special Section PAPER (Special Section on Recent Development of Electromechanical Devices (Selected Papers from IS-EMD2005))
Category: Contact Phenomena
Keyword: 
dark bridgebridge shapethermal expansion
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Relationship between Length and Diameter of Contact Bridge Formed under Thermal Equilibrium Condition
Hiroyuki ISHIDA Masanari TANIGUCHI Hideaki SONE Hiroshi INOUE Tasuku TAKAGI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/08/01
Vol. E88-C  No. 8  pp. 1566-1572
Type of Manuscript:  Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices--Selected Papers from International Session on Electro-Mechanical Devices 2004 (IS-EMD2004)--)
Category: Contact Phenomena
Keyword: 
contact bridgethermal flowthermal equilibrium condition
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Experimental Study on the Relationships between Bridge-Voltage and Gap Length in Slowly Opening Ag Contacts
Hiroyuki ISHIDA Masanari TANIGUCHI Tasuku TAKAGI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/06/01
Vol. E86-C  No. 6  pp. 880-884
Type of Manuscript:  Special Section PAPER (Special Issue on Recent Development of Electro-Mechanical Devices (IS-EMD 2002))
Category: Contact Phenomena
Keyword: 
electrical contactbridge-voltagecontact gap
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Application of Digital Image Measuring System (DIMS) and Shadow Image Processing Technique (SIPT) to Damage Analysis of Electrical Sliding Contact Surface
Masanari TANIGUCHI Miyataka KANAZAWA Tasuku TAKAGI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/03/25
Vol. E81-C  No. 3  pp. 377-383
Type of Manuscript:  Special Section PAPER (Special Issue on Electromechanical Devices and their Surface Science)
Category: 
Keyword: 
electrical sliding contactdamage analysis of contact surfacedigital image measuring systemshadow image processing technique
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Holographic Pattern Measurement of Printed Circuit Board (PCB) Vibration due to Mounted Electromagnetic Relay Operation
Masanari TANIGUCHI Junichi FUKUDA Tasuku TAKAGI Isamu AKASAKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1993/07/25
Vol. E76-A  No. 7  pp. 1170-1173
Type of Manuscript:  Special Section LETTER (Special Section of Letters Selected from the 1993 IEICE Spring Conference)
Category: 
Keyword: 
printed circuit boardvibration measurementelectromagnetic relayholography
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Observation of Electrical Contact Surface by Using Digital Image Signal Processing System
Masanari TANIGUCHI Morimichi MIZUNO Hideaki SONE Tasuku TAKAGI 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1989/10/25
Vol. E72-E  No. 10  pp. 1069-1071
Type of Manuscript:  Special Section LETTER (Special Issue on 1989 Autumn National Convention IEICE)
Category: Component and Materials
Keyword: 
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An Experiment on a Relationship between Contact Voltage and Thermal Deformation of Contact Spring
Masanari TANIGUCHI Masato OKI Tasuku TAKAGI 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1988/04/25
Vol. E71-E  No. 4  pp. 272-273
Type of Manuscript:  Special Section LETTER (Special Issue: Papers from 1988 Spring Convention IEICE)
Category: Components and Materials
Keyword: 
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An Application of Holographic Pattern Measuring Method for the Thermal Distortion of Printed Circuit Board (PCB) Due to Current Flow
Masanari TANIGUCHI Masato OKI Tasuku TAKAGI 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1987/11/25
Vol. E70-E  No. 11  pp. 1086-1088
Type of Manuscript:  Special Section LETTER (Special Issue: Papers from 1987 National Conference on Semicondutor Devices and Materials IEICE)
Category: Measurement
Keyword: 
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