Masamichi OHMORI


Reliability Life Tests on an Encapsulated Millimeter-Wave DDR IMPATT Diode
Masamichi OHMORI Masayuki INO Masatomo FUJIMOTO Hiroyuki NAGAO Nobuhiko FUJINE Kenji SEKIDO 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1980/06/25
Vol. E63-E  No. 6  pp. 409-413
Type of Manuscript:  PAPER
Category: Electron Devices
Keyword: 
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