Masaki OOHIRA


Dynamic Simulation of Multiple Trapping Processes and Anomalous Frequency Dependence in GaAs MESFETs
Shirun HO Masaki OOHIRA Osamu KAGAYA Aya MORIYOSHI Hiroshi MIZUTA Ken YAMAGUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/02/25
Vol. E77-C  No. 2  pp. 187-193
Type of Manuscript:  Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93))
Category: Device Simulation
Keyword: 
frequency dependent characteristicsdynamic simulationdeep trapsquasi-Fermi levelsGaAs MESFETs
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