Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/02/25 Vol. E79-CNo. 2pp. 206-210 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Reliability Analysis Keyword: test structure, very low-level current, atto amperes, measurement technique,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1994/01/25 Vol. E77-ANo. 1pp. 158-165 Type of Manuscript: Special Section PAPER (Special Section on Reliability) Category: Failure Physics and Failure Analysis Keyword: T-Shaped gate HEMT, von Mises stress, recess depth, stress concentration,