Makoto YOSHIMI


Study of LOCOS-Induced Anomalous Leakage Current in Thin Film SOI MOSFET's
Shigeru KAWANAKA Shinji ONGA Takako OKADA Michihiro OOSE Toshihiko IINUMA Tomoaki SHINO Takashi YAMADA Makoto YOSHIMI Shigeyoshi WATANABE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/07/25
Vol. E82-C  No. 7  pp. 1341-1346
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
SOILOCOS isolationcrystal defectleakage currentstress
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An Ultra Low Voltage SOI CMOS Pass-Gate Logic
Tsuneaki FUSE Yukihito OOWAKI Mamoru TERAUCHI Shigeyoshi WATANABE Makoto YOSHIMI Kazunori OHUCHI Jun'ichi MATSUNAGA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/03/25
Vol. E80-C  No. 3  pp. 472-477
Type of Manuscript:  Special Section PAPER (Special Issue on SOI Devices and Their Process Technologies)
Category: 
Keyword: 
SOI0.5 V operationultra low voltagepass-gate logicbody-bias control
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Simulation of Velocity Overshoot and Hot Carrier Effects in Thin-Film SOI-nMOSFETs
Kazuya MATSUZAWA Minoru TAKAHASHI Makoto YOSHIMI Naoyuki SHIGYO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/12/25
Vol. E75-C  No. 12  pp. 1477-1483
Type of Manuscript:  Special Section PAPER (Special Issue on SOI (Si on Insulator) Devices)
Category: Hot Carrier
Keyword: 
SOIenergy transportvelocity overshoothot carrier
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Electrical Properties and Technological Perspectives of Thin-Film SOI MOSFETs
Makoto YOSHIMI Minoru TAKAHASHI Shigeru KAMBAYASHI Masato KEMMOCHI Hiroaki HAZAMA Tetsunori WADA Koichi KATO Hiroyuki TANGO Kenji NATORI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1991/02/25
Vol. E74-C  No. 2  pp. 337-351
Type of Manuscript:  INVITED PAPER
Category: 
Keyword: 
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Three-Dimensional Simulation of Hot Carrier Effects in Submicron MOSFETs
Naoyuki SHIGYO Shinji ONGA Makoto YOSHIMI Kenji TANIGUCHI 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1986/04/25
Vol. E69-E  No. 4  pp. 248-250
Type of Manuscript:  Special Section LETTER (Special Issue: Papers from 1986 National Convention IECE Japan)
Category: Silicon Devices and Integrated Circuits
Keyword: 
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