Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2003/07/01
Vol. E86-C
No. 7
pp. 1328-1337
Type of Manuscript:
INVITED PAPER (Special Issue on Recent Progress in Microwave and Millimeter-wave Photonics Technologies)
Category: Measurements Techniques
Keyword:
microwave measurements, ultrafast optics, electro-optic sampling, electric-field probing, |