Li TIAN

Integrating Multiple Global and Local Features by Product Sparse Coding for Image Retrieval
Li TIAN Qi JIA Sei-ichiro KAMATA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/03/01
Vol. E99-D  No. 3  pp. 731-738
Type of Manuscript:  PAPER
Category: Image Recognition, Computer Vision
Keyword: 
image retrieval, image representation, Trimmed-Root (TR)-feature, Product Sparse Coding (PSC), ranking strategy, 
 Summary | Full Text:PDF(875KB)
A Two-Stage Point Pattern Matching Algorithm Using Ellipse Fitting and Dual Hilbert Scans
Li TIAN Sei-ichiro KAMATA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/10/01
Vol. E91-D  No. 10  pp. 2477-2484
Type of Manuscript:  PAPER
Category: Pattern Recognition
Keyword: 
point pattern matching, ellipse fitting, Hilbert scan, transformation parameter estimation, search space reduction, 
 Summary | Full Text:PDF(413.7KB)
Image Enhancement by Analysis on Embedded Surfaces of Images and a New Framework for Enhancement Evaluation
Li TIAN Sei-ichiro KAMATA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/07/01
Vol. E91-D  No. 7  pp. 1946-1954
Type of Manuscript:  Special Section PAPER (Special Section on Machine Vision and its Applications)
Category: 
Keyword: 
image enhancement, low contrast and low illumination, human vision system, image embedding, enhancement evaluation, 
 Summary | Full Text:PDF(4.7MB)
A New Framework for Constructing Accurate Affine Invariant Regions
Li TIAN Sei-ichiro KAMATA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/11/01
Vol. E90-D  No. 11  pp. 1831-1840
Type of Manuscript:  PAPER
Category: Image Recognition, Computer Vision
Keyword: 
affine invariant region, Path Growing, Thresholding Seeded Growing Regions, ellipse fitting, near-duplicate detection, 
 Summary | Full Text:PDF(1.8MB)
A Fast and Accurate Algorithm for Matching Images Using Hilbert Scanning Distance with Threshold Elimination Function
Li TIAN Sei-ichiro KAMATA Kazuyuki TSUNEYOSHI Haijiang TANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/01/01
Vol. E89-D  No. 1  pp. 290-297
Type of Manuscript:  PAPER
Category: Pattern Recognition
Keyword: 
point pattern matching, Hausdorff distance, Hilbert curve, Hilbert scanning distance, threshold elimination function, 
 Summary | Full Text:PDF(1.1MB)