CMOS Charge Pumps Using Cross-Coupled Charge Transfer Switches with Improved Voltage Pumping Gain and Low Gate-Oxide Stress for Low-Voltage Memory Circuits Kyeong-Sik MINJin-Hong AHN
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2002/01/01 Vol. E85-CNo. 1pp. 225-229 Type of Manuscript: LETTER Category: Electronic Circuits Keyword: charge pump, low voltage, memory circuit, low gate-oxide stress,