Kun-Hsien LIN


MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process
Ming-Dou KER Kun-Hsien LIN Che-Hao CHUANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/03/01
Vol. E88-C  No. 3  pp. 429-436
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
electrostatic discharge (ESD)diodepoly-bounded diodeMOS-bounded diodeESD protection
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