Koichiro NATSUME

Application of High Quality Built-in Test Using Neighborhood Pattern Generator to Industrial Designs
Kazumi HATAYAMA Michinobu NAKAO Yoshikazu KIYOSHIGE Koichiro NATSUME Yasuo SATO Takaharu NAGUMO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A  No. 12  pp. 3318-3323
Type of Manuscript:  Special Section LETTER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
BIST, test pattern generator, neighborhood pattern, LFSR, reseeding, 
 Summary | Full Text:PDF(429.3KB)
Deterministic Built-in Test with Neighborhood Pattern Generator
Michinobu NAKAO Yoshikazu KIYOSHIGE Koichiro NATSUME Kazumi HATAYAMA Satoshi FUKUMOTO Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/05/01
Vol. E85-D  No. 5  pp. 874-883
Type of Manuscript:  PAPER
Category: Fault Tolerance
Keyword: 
BIST, test pattern generator, reseeding, bit-flipping, seed generation, 
 Summary | Full Text:PDF(839.2KB)