Kohei MIYASE


Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation
Fuqiang LI Xiaoqing WEN Kohei MIYASE Stefan HOLST Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/12/01
Vol. E99-A  No. 12  pp. 2310-2319
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
at-speed scan testingIR-dropcapture-power-safetylogic pathclock pathclock stretchtest quality
 Summary | Full Text:PDF

On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST
Akihiro TOMITA Xiaoqing WEN Yasuo SATO Seiji KAJIHARA Kohei MIYASE Stefan HOLST Patrick GIRARD Mohammad TEHRANIPOOR Laung-Terng WANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/10/01
Vol. E97-D  No. 10  pp. 2706-2718
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
at-speed scan-based logic BISTcapture power safetymaskingIR-droptransition delay faultlong sensitized path
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Scan-Out Power Reduction for Logic BIST
Senling WANG Yasuo SATO Seiji KAJIHARA Kohei MIYASE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9  pp. 2012-2020
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
low powerBISTmulti-cycle testshift power
 Summary | Full Text:PDF

A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing
Kohei MIYASE Ryota SAKAI Xiaoqing WEN Masao ASO Hiroshi FURUKAWA Yuta YAMATO Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9  pp. 2003-2011
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
at-speed testingATPGIR-droptest power reductionlow power test
 Summary | Full Text:PDF

Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing
Kohei MIYASE Kenji NODA Hideaki ITO Kazumi HATAYAMA Takashi AIKYO Yuta YAMATO Hiroshi FURUKAWA Xiaoqing WEN Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2011/06/01
Vol. E94-D  No. 6  pp. 1216-1226
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
ATPGX-bitX-identificationX-filling
 Summary | Full Text:PDF

A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing
Yuta YAMATO Xiaoqing WEN Kohei MIYASE Hiroshi FURUKAWA Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2011/04/01
Vol. E94-D  No. 4  pp. 833-840
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
X-fillinggenetic algorithmlaunch switching activityIR-dropat-speed scan testing
 Summary | Full Text:PDF

A Study of Capture-Safe Test Generation Flow for At-Speed Testing
Kohei MIYASE Xiaoqing WEN Seiji KAJIHARA Yuta YAMATO Atsushi TAKASHIMA Hiroshi FURUKAWA Kenji NODA Hideaki ITO Kazumi HATAYAMA Takashi AIKYO Kewal K. SALUJA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/07/01
Vol. E93-A  No. 7  pp. 1309-1318
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
at-speed scan testingtest generationX-bit identificationX-fillingcapture-safety checking
 Summary | Full Text:PDF

High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme
Kohei MIYASE Xiaoqing WEN Hiroshi FURUKAWA Yuta YAMATO Seiji KAJIHARA Patrick GIRARD Laung-Terng WANG Mohammad TEHRANIPOOR 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D  No. 1  pp. 2-9
Type of Manuscript:  Special Section PAPER (Special Section on Test, Diagnosis and Verification of SOCs)
Category: 
Keyword: 
power supply noisetest relaxationX-fillingclock-gatingtest compaction
 Summary | Full Text:PDF

A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits
Yuta YAMATO Yusuke NAKAMURA Kohei MIYASE Xiaoqing WEN Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3  pp. 667-674
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Fault Diagnosis
Keyword: 
fault diagnosisX-fault modelper-testvia
 Summary | Full Text:PDF

On Detection of Bridge Defects with Stuck-at Tests
Kohei MIYASE Kenta TERASHIMA Xiaoqing WEN Seiji KAJIHARA Sudhakar M. REDDY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3  pp. 683-689
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Defect-Based Testing
Keyword: 
defect based testingtest vector generationtest vector modificationbridging faultsfault extraction
 Summary | Full Text:PDF

A Novel ATPG Method for Capture Power Reduction during Scan Testing
Xiaoqing WEN Seiji KAJIHARA Kohei MIYASE Tatsuya SUZUKI Kewal K. SALUJA Laung-Terng WANG Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/09/01
Vol. E90-D  No. 9  pp. 1398-1405
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
scan testingcapture powerX-bitIR-drop
 Summary | Full Text:PDF

A Per-Test Fault Diagnosis Method Based on the X-Fault Model
Xiaoqing WEN Seiji KAJIHARA Kohei MIYASE Yuta YAMATO Kewal K. SALUJA Laung-Terng WANG Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/11/01
Vol. E89-D  No. 11  pp. 2756-2765
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
fault diagnosisper-testX-fault model
 Summary | Full Text:PDF

Don't Care Identification and Statistical Encoding for Test Data Compression
Seiji KAJIHARA Kenjiro TANIGUCHI Kohei MIYASE Irith POMERANZ Sudhakar M. REDDY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3  pp. 544-550
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Test Generation and Compaction
Keyword: 
test compressiondon't care identificationHuffman's algorithmtest generation
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Average Power Reduction in Scan Testing by Test Vector Modification
Seiji KAJIHARA Koji ISHIDA Kohei MIYASE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10  pp. 1483-1489
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Test Generation and Modification
Keyword: 
test power reductionscan testingATPGtest modification
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