IEICE Trans

Kiyotaka KOMOKU

Modeling and Layout Optimization of MOM Capacitor for High-Frequency Applications Yuka ITANO Taishi KITANO Yuta SAKAMOTO Kiyotaka KOMOKU Takayuki MORISHITA Nobuyuki ITOH
Publication: Publication Date: 2018/02/01 Vol. E101-A No. 2 pp. 441-446 Type of Manuscript: Special Section LETTER (Special Section on Analog Circuit Techniques and Related Topics) Category: Keyword: MOM capacitor, parasitic resistance, parasitic inductance, layout optimization,
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A Study of Striped Inductor for K- and Ka-Band Voltage-Controlled Oscillators Nobuyuki ITOH Hiroki TSUJI Yuka ITANO Takayuki MORISHITA Kiyotaka KOMOKU Sadayuki YOSHITOMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2016/06/01 Vol. E99-C No. 6 pp. 614-622 Type of Manuscript: INVITED PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies) Category: Keyword: skin effect, striped inductor, Q factor, corner frequency, voltage-controlled oscillator, phase noise,
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Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide Toshihiro MATSUDA Shinsuke ISHIMARU Shingo NOHARA Hideyuki IWATA Kiyotaka KOMOKU Takayuki MORISHITA Takashi OHZONE
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2009/12/01 Vol. E92-C No. 12 pp. 1523-1530 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: MOS capacitors, Si-implantation, thermal oxide, I-V hysteresis, hysteresis window, nonvolatile memory,
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A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs Toshihiro MATSUDA Yuya SUGIYAMA Keita NOHARA Kazuhiro MORITA Hideyuki IWATA Takashi OHZONE Takayuki MORISHITA Kiyotaka KOMOKU
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2008/08/01 Vol. E91-C No. 8 pp. 1331-1337 Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures (ICMTS2007)) Category: Keyword: CMOS, symmetry, orientation dependence, drain current, substrate current,
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A CMOS Temperature Sensor Circuit Takashi OHZONE Tatsuaki SADAMOTO Takayuki MORISHITA Kiyotaka KOMOKU Toshihiro MATSUDA Hideyuki IWATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2007/04/01 Vol. E90-C No. 4 pp. 895-902 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: CMOS, temperature sensor, temperature dependent voltage, subthreshold current,
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A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width Takashi OHZONE Eiji ISHII Takayuki MORISHITA Kiyotaka KOMOKU Toshihiro MATSUDA Hideyuki IWATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2007/02/01 Vol. E90-C No. 2 pp. 515-522 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: CMOSFET, reliability, LDD-type, channel width, isolation,
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A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET Takashi OHZONE Kazuhiko OKADA Takayuki MORISHITA Kiyotaka KOMOKU Toshihiro MATSUDA Hideyuki IWATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/09/01 Vol. E89-C No. 9 pp. 1351-1357 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: CMOSFET, LDD-type, source/drain-resistance, sheet resistance,
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