IEICE Trans

Kenji NISHI

NP-Hard and k-EXPSPACE-Hard Cast Puzzles Chuzo IWAMOTO Kento SASAKI Kenji NISHIO Kenichi MORITA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2010/11/01 Vol. E93-D No. 11 pp. 2995-3004 Type of Manuscript: PAPER Category: Fundamentals of Information Systems Keyword: computational complexity, NP-hard, k-EXPSPACE hard, cast puzzle,
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Object Tracking by Maximizing Classification Score of Detector Based on Rectangle Features Akinori HIDAKA Kenji NISHIDA Takio KURITA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2008/08/01 Vol. E91-D No. 8 pp. 2163-2170 Type of Manuscript: PAPER Category: Image Recognition, Computer Vision Keyword: object detection, tracking, support vector tracker, rectangle features, boosting,
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Optimal-Routed Soft Handover in IP-Based Mobile Networks Kenji NISHIMURA Hiroshi KAWAKAMI Shoichi HIRATA Masami YABUSAKI
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2004/09/01 Vol. E87-B No. 9 pp. 2576-2584 Type of Manuscript: Special Section PAPER (Special Section on Networking Technologies for Mobile Internet Systems) Category: Mobility Management Keyword: soft handover, redundant path, optimal route, relocation, OSPF,
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Statistical Threshold Voltage Fluctuation Analysis by Monte Carlo Ion Implantation Method Yoshinori ODA Yasuyuki OHKURA Kaina SUZUKI Sanae ITO Hirotaka AMAKAWA Kenji NISHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/03/01 Vol. E86-C No. 3 pp. 416-420 Type of Manuscript: Special Section PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02)) Category: Keyword: threshold voltage fluctuation, three dimensional simulation, statistical dopant variation, Monte Carlo method,
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Analysis of Injection Current with Electron Temperature for High-K Gate Stacks Yasuyuki OHKURA Hiroyuki TAKASHINO Shoji WAKAHARA Kenji NISHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/03/01 Vol. E86-C No. 3 pp. 325-329 Type of Manuscript: Special Section PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02)) Category: Keyword: high-K, gate injection current, simulation, electron temperature,
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PDL Suppression on Long-Period Fiber Gratings by Azimuthally Isotropic Exposure Yuu ISHII Kensuke SHIMA Satoshi OKUDE Kenji NISHIDE Akira WADA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2002/04/01 Vol. E85-C No. 4 pp. 934-939 Type of Manuscript: Special Section PAPER (Special Issue on Optical Fibers and Devices) Category: Keyword: long-period fiber grating, polarization-dependent loss (PDL), birefringence, polarization mode dispersion (PMD),
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A Network-Supported Server Load Balancing Method: Active Anycast Miki YAMAMOTO Hirokazu MIURA Kenji NISHIMURA Hiromasa IKEDA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2001/06/01 Vol. E84-B No. 6 pp. 1561-1568 Type of Manuscript: Special Section PAPER (Special Issue on New Developments on QoS Technologies for Information Networks) Category: Keyword: active network, anycast, server load balancing, web server,
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FOREWORD Kenji NISHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2000/08/25 Vol. E83-C No. 8 pp. 1173-1174 Type of Manuscript: FOREWORD Category: Keyword:
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Systematic Yield Simulation Methodology Applied to Fully-Depleted SOI MOSFET Process Noriyuki MIURA Hirokazu HAYASHI Koichi FUKUDA Kenji NISHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2000/08/25 Vol. E83-C No. 8 pp. 1288-1294 Type of Manuscript: Special Section PAPER (Special Issue on 1999 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'99)) Category: Simulation Methodology and Environment Keyword: fully-depleted SOI, floating-body effect, parasitic channel leakage, systematic yield, process optimization,
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Characteristics of Long-Period Fiber Grating Utilizing Periodic Stress Relaxation Shigefumi YAMASAKI Masaaki AKIYAMA Kenji NISHIDE Akira WADA Ryozo YAMAUCHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2000/03/25 Vol. E83-C No. 3 pp. 440-443 Type of Manuscript: Special Section PAPER (Special Issue on Optical Fiber Sensors) Category: Passive and Active Devices for Photonic Sensing Keyword: long-period fiber grating, high-silica core fiber, CO₂ laser,
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Inverse Modeling and Its Application to MOSFET Channel Profile Extraction Hirokazu HAYASHI Hideaki MATSUHASHI Koichi FUKUDA Kenji NISHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1999/06/25 Vol. E82-C No. 6 pp. 862-869 Type of Manuscript: INVITED PAPER (Special Issue on TCAD for Semiconductor Industries) Category: Keyword: inverse modeling, doping profile extraction, MOSFET, threshold voltage,
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Evaluation of Software Development Productivity and Analysis of Productivity Improvement Methods for Switching Systems Hiroshi SUNAGA Tetsuyasu YAMADA Kenji NISHIKAWARA Tatsuro MURAKAMI
Publication: IEICE TRANSACTIONS on Communications Publication Date: 1998/12/25 Vol. E81-B No. 12 pp. 2519-2527 Type of Manuscript: PAPER Category: Switching and Communication Processing Keyword: productivity, SDE, software platform, object-oriented design,
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Automatic Code Production of Office Data Handling Programs for Switching Systems Hiroshi SUNAGA Hajime MATSUMURA Takashige HAYASHI Kenji NISHIKAWARA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 1998/10/25 Vol. E81-B No. 10 pp. 1831-1839 Type of Manuscript: PAPER Category: Switching and Communication Processing Keyword: office data, on-line modification, automatic coding, software platform,
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Increased Software Reusability in a Communication Switching Platform Based on Object-Oriented Design Hiroshi SUNAGA Makoto FURUKAWA Kenji NISHIKAWARA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 1997/09/25 Vol. E80-B No. 9 pp. 1300-1310 Type of Manuscript: PAPER Category: Communication Software Keyword: switching software, common software platform, software reuse, object-oriented design,
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A New Wide Applicable Mobility Model for Device Simulation Taking Physics-Based Carrier Screening Effects into Account Koichi FUKUDA Kenji NISHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1995/03/25 Vol. E78-C No. 3 pp. 281-287 Type of Manuscript: Special Section PAPER (Special Issue on Sub-1/4 Micron Device and Process Technologies) Category: Keyword: device simulation, mobility, carrier screening, impurity scattering, MOSFET,
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Two-Dimensional Modeling of Self-Aligned Silicide Processes with the General-Purpose Process Simulator OPUS Kazuhiko KAI Shigeki KURODA Kenji NISHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/02/25 Vol. E77-C No. 2 pp. 129-133 Type of Manuscript: Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93)) Category: Process Simulation Keyword: process simulation, model for silicide growth, SALICIDE, silicidation, titanium disilicide, MOSFET,
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Simulation of Stress Redistribution on LOCOS Structure during Oxidation and Subsequent Cooling Down Shigeki KURODA Kenji NISHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/02/25 Vol. E75-C No. 2 pp. 145-149 Type of Manuscript: Special Section PAPER (Special Issue on Selected Papers from '91 VPAD) Category: Keyword: simulation, local oxidation of silicon, stress redistribution, viscoelastic model, finite element method,
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