Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1995/09/25 Vol. E78-CNo. 9pp. 1195-1202 Type of Manuscript: Special Section PAPER (Special Issue on Ultra-High-Speed Electron Devices) Category: Keyword: MUX, DEMUX, GaAs, 2.5 Gbps, power,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1994/01/25 Vol. E77-ANo. 1pp. 158-165 Type of Manuscript: Special Section PAPER (Special Section on Reliability) Category: Failure Physics and Failure Analysis Keyword: T-Shaped gate HEMT, von Mises stress, recess depth, stress concentration,