Kenji HAMANO


A Randomness Test Based on T-Complexity
Kenji HAMANO Hirosuke YAMAMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/07/01
Vol. E93-A  No. 7  pp. 1346-1354
Type of Manuscript:  PAPER
Category: Cryptography and Information Security
Keyword: 
T-codeT-complexityLempel-Ziv complexityNIST SP 800-22NIST statistical test suitemultiplicative congruential generator
 Summary | Full Text:PDF

A New Randomness Test Based on Linear Complexity Profile
Kenji HAMANO Fumio SATO Hirosuke YAMAMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/01/01
Vol. E92-A  No. 1  pp. 166-172
Type of Manuscript:  Special Section PAPER (Special Section on Cryptography and Information Security)
Category: Mathematics
Keyword: 
randomness testlinear complexity profileNIST SP800-22
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Correction of Overlapping Template Matching Test Included in NIST Randomness Test Suite
Kenji HAMANO Toshinobu KANEKO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2007/09/01
Vol. E90-A  No. 9  pp. 1788-1792
Type of Manuscript:  Special Section PAPER (Special Section on Information Theory and Its Applications)
Category: 
Keyword: 
overlapping template matching testNIST randomness test suiteSP800-22pass rate
 Summary | Full Text:PDF

The Distribution of the Spectrum for the Discrete Fourier Transform Test Included in SP800-22
Kenji HAMANO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/01/01
Vol. E88-A  No. 1  pp. 67-73
Type of Manuscript:  Special Section PAPER (Special Section on Cryptography and Information Security)
Category: Symmetric Key Cryptography
Keyword: 
discrete Fourier transformrandom numberstatistical testSP800-22NISTcentral limit theorem
 Summary | Full Text:PDF