Kenichiro TATSUUMA

A Simulation Methodology for Bidirectional Hot-Carrier Degradation in a Static RAM Circuit
Norio KOIKE Masato TAKEO Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/06/25
Vol. E81-C  No. 6  pp. 959-967
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
hot carrier, bidirectional stressing, circuit reliability, simulation, 
 Summary | Full Text:PDF(742.9KB)
Hot-Carrier Aging Simulations of Voltage Controlled Oscillator
Norio KOIKE Hirokazu NISHIMURA Masato TAKEO Tomoyuki MORII Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/09/25
Vol. E79-C  No. 9  pp. 1285-1288
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
hot carrier, circuit reliability, simulation, BERT, 
 Summary | Full Text:PDF(343.8KB)