Ken TAKEUCHI


Reliability Analysis of Scaled NAND Flash Memory Based SSDs with Real Workload Characteristics by Using Real Usage-Based Precise Reliability Test
Yusuke YAMAGA Chihiro MATSUI Yukiya SAKAKI Ken TAKEUCHI 
Publication:   
Publication Date: 2018/04/01
Vol. E101-C  No. 4  pp. 243-252
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
solid-state drivereliabilityNAND flash memory
 Summary | Full Text:PDF(1.7MB)

Workload-Based Co-Design of Non-Volatile Cache Algorithm and Storage Class Memory Specifications for Storage Class Memory/NAND Flash Hybrid SSDs
Tomoaki YAMADA Chihiro MATSUI Ken TAKEUCHI 
Publication:   
Publication Date: 2017/04/01
Vol. E100-C  No. 4  pp. 373-381
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
solid-state drivestorage class memoryNAND flash memory
 Summary | Full Text:PDF(2.8MB)

Variation of SCM/NAND Flash Hybrid SSD Performance, Reliability and Cost by Using Different SSD Configurations and Error Correction Strengths
Hirofumi TAKISHITA Shuhei TANAKAMARU Sheyang NING Ken TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/04/01
Vol. E99-C  No. 4  pp. 444-451
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design---Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
solid-state drivestorage-class memoryNAND flash memoryerror correcting code
 Summary | Full Text:PDF(2.1MB)

A Design Strategy of Error-Prediction Low-Density Parity-Check (EP-LDPC) Error-Correcting Code (ECC) and Error-Recovery Schemes for Scaled NAND Flash Memories
Shuhei TANAKAMARU Masafumi DOI Ken TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/01/01
Vol. E98-C  No. 1  pp. 53-61
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
Error-correcting codeECClow-density parity-checkLDPCNAND flash memory
 Summary | Full Text:PDF(2.2MB)

A Temperature Tracking Read Reference Current and Write Voltage Generator for Multi-Level Phase Change Memories
Koh JOHGUCHI Toru EGAMI Kousuke MIYAJI Ken TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/04/01
Vol. E97-C  No. 4  pp. 342-350
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design,---,Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
phase change memoryreference current generationreference voltage generationband-gap reference circuit
 Summary | Full Text:PDF(3.7MB)

NAND Phase Change Memory with Block Erase Architecture and Pass-Transistor Design Requirements for Write and Disturbance
Koh JOHGUCHI Kasuaki YOSHIOKA Ken TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/04/01
Vol. E97-C  No. 4  pp. 351-359
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design,---,Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
phase change memorynon-volatile memorystorage class memoryblock erase interfacesolid-state drive
 Summary | Full Text:PDF(2.8MB)

Initialize and Weak-Program Erasing Scheme for High-Performance and High-Reliability Ferroelectric NAND Flash Solid-State Drive
Kousuke MIYAJI Ryoji YAJIMA Teruyoshi HATANAKA Mitsue TAKAHASHI Shigeki SAKAI Ken TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4  pp. 609-616
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
ferroelectric FETNAND flash memorysolid-state drivebit-by-bit verifying techniquehistory effect
 Summary | Full Text:PDF(1.8MB)

Analysis of Operation Margin and Read Speed in 6T- and 8T-SRAM with Local Electron Injected Asymmetric Pass Gate Transistor
Kousuke MIYAJI Kentaro HONDA Shuhei TANAKAMARU Shinji MIYANO Ken TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4  pp. 564-571
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
6T/8T-SRAMasymmetric pass gate transistorlocal electron injectiondisturb/write marginread speed
 Summary | Full Text:PDF(4.5MB)

Improvement of Read Disturb, Program Disturb and Data Retention by Memory Cell VTH Optimization of Ferroelectric (Fe)-NAND Flash Memories for Highly Reliable and Low Power Enterprise Solid-State Drives (SSDs)
Teruyoshi HATANAKA Mitsue TAKAHASHI Shigeki SAKAI Ken TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4  pp. 539-547
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
NAND flash memoryferroelectricsolid-state driveSSD
 Summary | Full Text:PDF(1.4MB)

Inductor and TSV Design of 20-V Boost Converter for Low Power 3D Solid State Drive with NAND Flash Memories
Tadashi YASUFUKU Koichi ISHIDA Shinji MIYAMOTO Hiroto NAKAI Makoto TAKAMIYA Takayasu SAKURAI Ken TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/03/01
Vol. E93-C  No. 3  pp. 317-323
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
SSDboost convertercharge pumpinductor designTSV's
 Summary | Full Text:PDF(1.3MB)

A Double-Leve1-Vth Select Gate Array Architecture for Multilevel NAND Flash Memories
Ken TAKEUCHI Tomoharu TANAKA Hiroshi NAKAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/07/25
Vol. E79-C  No. 7  pp. 1013-1020
Type of Manuscript:  Special Section PAPER (Special Issue on the 1995 Symposium on VLSI Circuits (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.31, No.4 April 1996))
Category: Memory
Keyword: 
 Summary | Full Text:PDF(637.2KB)