Keita NOHARA


A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs
Toshihiro MATSUDA Yuya SUGIYAMA Keita NOHARA Kazuhiro MORITA Hideyuki IWATA Takashi OHZONE Takayuki MORISHITA Kiyotaka KOMOKU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/08/01
Vol. E91-C  No. 8  pp. 1331-1337
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures (ICMTS2007))
Category: 
Keyword: 
CMOSsymmetryorientation dependencedrain currentsubstrate current
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