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A Low-Power Radiation-Hardened Flip-Flop with Stacked Transistors in a 65 nm FDSOI Process Haruki MARUOKA Masashi HIFUMI Jun FURUTA Kazutoshi KOBAYASHI | Publication:
Publication Date: 2018/04/01
Vol. E101-C
No. 4
pp. 273-280
Type of Manuscript:
Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology) Category: Keyword: single event effect, soft error, α particle, neutron, heavy ion, FDSOI, flip-flop, low-power consumption, | | Summary | Full Text:PDF | |
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Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs Michitarou YABUUCHI Ryo KISHIDA Kazutoshi KOBAYASHI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/12/01
Vol. E97-A
No. 12
pp. 2367-2372
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Device and Circuit Modeling and Analysis Keyword: BTI, process variation, reliability, | | Summary | Full Text:PDF | |
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FOREWORD Kazutoshi KOBAYASHI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A
No. 7
pp. 1443-1443
Type of Manuscript:
FOREWORD Category: Keyword:
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An Area/Delay Efficient Dual-Modular Flip-Flop with Higher SEU/SET Immunity Jun FURUTA Kazutoshi KOBAYASHI Hidetoshi ONODERA | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2010/03/01
Vol. E93-C
No. 3
pp. 340-346
Type of Manuscript:
Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration) Category: Keyword: TMR, built-in soft error, SEU, SET, | | Summary | Full Text:PDF | |
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A Comprehensive Simulation and Test Environment for Prototype VLSI Verification Kazutoshi KOBAYASHI Hidetoshi ONODERA | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D
No. 3
pp. 630-636
Type of Manuscript:
Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Verification Keyword: simulation, test, VLSI, tester, verification, | | Summary | Full Text:PDF | |
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An Efficient Motion Estimation Algorithm Using a Gyro Sensor Kazutoshi KOBAYASHI Ryuta NAKANISHI Hidetoshi ONODERA | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/03/01
Vol. E87-A
No. 3
pp. 530-538
Type of Manuscript:
Special Section PAPER (Special Section on Applications and Implementations of Digital Signal Processing) Category: Video/Image Coding Keyword: motion estimation, gyro sensor, MPEG-4, | | Summary | Full Text:PDF | |
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