Kazuo TERADA


Study on Threshold Voltage Variation Evaluated by Charge-Based Capacitance Measurement
Katsuhiro TSUJI Kazuo TERADA Ryo TAKEDA Hisato FUJISAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/04/01
Vol. E99-C  No. 4  pp. 466-473
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETC-V curveCBCMthreshold voltageflat-band voltagevariation
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Development of Test Structure for Variability Evaluation using Charge-Based Capacitance Measurement
Katsuhiro TSUJI Kazuo TERADA Ryota KIKUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/11/01
Vol. E97-C  No. 11  pp. 1117-1123
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETC-V curveCBCMvariability
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Implementation of the Multicolored SOR Method on a Vector Supercomputer
Seiji FUJINO Ryutaro HIMENO Akira KOJIMA Kazuo TERADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1997/04/25
Vol. E80-D  No. 4  pp. 518-523
Type of Manuscript:  Special Section PAPER (Special Issue on Parallel and Distributed Supercomputing)
Category: 
Keyword: 
multicolorSOR methodPDEvector lengthstencil
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A Capacitor over Bit-Line (COB) Stacked Capacitor Cell Using Local Interconnect Layer for 64 MbDRAMs
Naoki KASAI Masato SAKAO Toshiyuki ISHIJIMA Eiji IKAWA Hirohito WATANABE Toshio TAKESHIMA Nobuhiro TANABE Kazuo TERADA Takamaro KIKKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/04/25
Vol. E76-C  No. 4  pp. 548-555
Type of Manuscript:  Special Section PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
DRAMmemory cellstacked capacitorlocal interconnect
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Double Boron-Ion Implanted Short Channel MOS FET for High Speed Static RAMs
Kazuo TERADA 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1980/08/25
Vol. E63-E  No. 8  pp. 567-573
Type of Manuscript:  PAPER
Category: Semiconductors
Keyword: 
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