Kazunari HARADA


Optical Path Cross-Connect System Using Matrix Wavelength Division Multiplex Scheme
Kazunari HARADA Kenji SHIMIZU Nobuhiro SUGANO Teruhiko KUDOU Takeshi OZEKI 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1999/02/25
Vol. E82-B  No. 2  pp. 344-348
Type of Manuscript:  Special Section PAPER (Joint Special Issue on Photonics in Switching: Systems and Devices)
Category: Circuit Switching and Cross-Connecting
Keyword: 
optical cross connectwavelength division multiplexcrosstalkoptical pathhierarchy
 Summary | Full Text:PDF

Transfer Function Matrix Measurement of AWG Multi/Demulti-Plexers
Kazunari HARADA Kenji SHIMIZU Nobuhiro SUGANO Teruhiko KUDOU Takeshi OZEKI 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1999/02/25
Vol. E82-B  No. 2  pp. 401-405
Type of Manuscript:  Special Section PAPER (Joint Special Issue on Photonics in Switching: Systems and Devices)
Category: Photonic WDM Devices
Keyword: 
wavelength division multiplexmeasurementpolarization mode dispersioneye degradation
 Summary | Full Text:PDF

Optical Path Cross-Connect System Using Matrix Wavelength Division Multiplex Scheme
Kazunari HARADA Kenji SHIMIZU Nobuhiro SUGANO Teruhiko KUDOU Takeshi OZEKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/02/25
Vol. E82-C  No. 2  pp. 292-296
Type of Manuscript:  Special Section PAPER (Joint Special Issue on Photonics in Switching: Systems and Devices)
Category: Circuit Switching and Cross-Connecting
Keyword: 
optical cross connectwavelength division multiplexcrosstalkoptical pathhierarchy
 Summary | Full Text:PDF

Transfer Function Matrix Measurement of AWG Multi/Demulti-Plexers
Kazunari HARADA Kenji SHIMIZU Nobuhiro SUGANO Teruhiko KUDOU Takeshi OZEKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/02/25
Vol. E82-C  No. 2  pp. 349-353
Type of Manuscript:  Special Section PAPER (Joint Special Issue on Photonics in Switching: Systems and Devices)
Category: Photonic WDM Devices
Keyword: 
wavelength division multiplexmeasurementpolarization mode dispersioneye degradation
 Summary | Full Text:PDF

ESR Study of MOSFET Characteristics Degradation Mechanism by Water in Intermetal Oxide
Kazunari HARADA Naoki HOSHINO Mariko Takayanagi TAKAGI Ichiro YOSHII 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4  pp. 595-600
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
waterESRhot carrierintermetal oxidesilicon dangling bond
 Summary | Full Text:PDF