IEICE SEARCH SYSTEM

Katsuyuki MACHIDA

Logic and Analog Test Schemes for a Single-Chip Pixel-Parallel Fingerprint Identification LSI Satoshi SHIGEMATSU Hiroki MORIMURA Toshishige SHIMAMURA Takahiro HATANO Namiko IKEDA Yukio OKAZAKI Katsuyuki MACHIDA Mamoru NAKANISHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2007/10/01 Vol. E90-C No. 10 pp. 1892-1899 Type of Manuscript: Special Section PAPER (Special Section on VLSI Technology toward Frontiers of New Market) Category: Image Sensor/Vision Chip Keyword: test, pixel parallel, sensor, fingerprint identification, single chip, high-functional device, MEMS,
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Fingerprint Image Enhancement and Rotation Schemes for a Single-Chip Fingerprint Sensor and Identifier Satoshi SHIGEMATSU Koji FUJII Hiroki MORIMURA Takahiro HATANO Mamoru NAKANISHI Namiko IKEDA Toshishige SHIMAMURA Katsuyuki MACHIDA Yukio OKAZAKI Hakaru KYURAGI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/04/01 Vol. E89-C No. 4 pp. 540-550 Type of Manuscript: PAPER Category: Electronic Circuits Keyword: fingerprint identification, fingerprint sensor, pixel array, pixel parallel, image processing, image rotation,
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Pixel-Parallel Image-Matching Circuit Schemes for a Single-Chip Fingerprint Sensor and Identifier Satoshi SHIGEMATSU Hiroki MORIMURA Katsuyuki MACHIDA Yukio OKAZAKI Hakaru KYURAGI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/05/01 Vol. E88-C No. 5 pp. 1070-1078 Type of Manuscript: PAPER Category: Electronic Circuits Keyword: pixel parallel, image processing, pattern matching, fingerprint, sensor,
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An Adaptive Fingerprint-Sensing Scheme for a User Authentication System with a Fingerprint Sensor LSI Hiroki MORIMURA Satoshi SHIGEMATSU Toshishige SHIMAMURA Koji FUJII Chikara YAMAGUCHI Hiroki SUTO Yukio OKAZAKI Katsuyuki MACHIDA Hakaru KYURAGI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2004/05/01 Vol. E87-C No. 5 pp. 791-800 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: fingerprint sensor, adaptive fingerprint-sensing, adjustable A/D conversion, fingerprint image quality evaluation,
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The Influence of Stud Bumping above the MOSFETs on Device Reliability Nobuhiro SHIMOYAMA Katsuyuki MACHIDA Masakazu SHIMAYA Hideo AKIYA Hakaru KYURAGI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2000/05/25 Vol. E83-A No. 5 pp. 851-856 Type of Manuscript: Special Section PAPER (Special Section on Reliability Theory and Its Applications) Category: Keyword: stud bump, stress, interface traps, hot carrier, annealing,
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